Scanning tunneling spectroscopic studies of the effects of dielectrics and metallic substrates on the local electronic characteristics of graphene

“Scanning tunneling spectroscopic studies of the effects of dielectrics and metallic substrates on the local electronic characteristics of graphene” N.-C. Yeh, M. L. Teague, D. A. Boyd, M. W. Bockrath, J. Velasco, and C.-N. Lau, invited paper in ECS Transactions – Vancouver, Canada, Volume 28, Issure 5, “Graphene, Ge/III-V, and Emerging Materials for Post-CMOS Applications 2”, page 115 – 123, April (2010).
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