“Scanning tunneling spectroscopic studies of the effects of dielectrics and metallic substrates on the local electronic characteristics of graphene” N.-C. Yeh, M. L. Teague, D. A. Boyd, M. W. Bockrath, J. Velasco, and C.-N. Lau, invited paper in ECS Transactions – Vancouver, Canada, Volume 28, Issure 5, “Graphene, Ge/III-V, and Emerging Materials for Post-CMOS Applications 2”, page 115 – 123, April (2010).
Link to PDF